SCANFLEX II - Controller for embedded testing and programming
The SCANFLEX II CUBE is a new generation of modular JTAG/Boundary Scan controllers. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens up new avenues for embedded JTAG solutions. The versatile architecture of SCANFLEX II CUBE allows users to flexibly combine multiple technologies and achieve high performance on a single platform.
* Embedded board test: can significantly improve the test depth of complex boards, even without pointers
* Embedded functional testing in parallel with embedded programming
* No external programmer required
characteristic
* 8 independent, parallel test access ports (TAP) up to 100 MHz
* Synchronous operation of embedded test, debug and programming
* Programmable, multi-function 64-channel I/O signal unit
* Programmable TAP protocol for various processor debug interfaces
* Supports up to 31 parallel control SCANFLEX I/O modules
* Controlable via USB 3.0 and Gigabit LAN
